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| CAV accepted papers | ||||||||||||
Regular papersParosh
Aziz Abdulla, Bengt Jonsson, Pritha Mahata, and Julien d'Orso; Uppsala U,
Sweden Rajeev
Alur, Michael McDougall, and Zijiang Yang; U Pennsylvania, USA Alessandro
Armando, U Genova, Italy et al. Eugene
Asarin, Thao Dang, and Oded Maler; IMAG Grenoble, France Eugene
Asarin, IMAG Grenoble, France; Gordon Pace, INRIA Rhône-Alpes, France; Gerardo
Schneider, IMAG Grenoble, France; and Sergio Yovine, IMAG Grenoble, France Sharon
Barner, Daniel Geist, and Anna Gringauze; IBM Haifa, Israel Sharon
Barner, IBM Haifa, Israel and Orna Grumberg, Israel Inst. of Techn. Clark
W. Barrett, David L. Dill, and Aaron Stump; Stanford U, USA Jason
Baumgartner, IBM Enterprise Systems Group, USA; Andreas Kuehlmann, Cadence
Design Systems, USA; and Jacob Abraham, U Texas-Austin, USA Shoham
Ben-David, Anna Gringauze, Baruch Sterin, and Yaron Wolfsthal; IBM Haifa,
Israel Jesse
D. Bingham and Alan J. Hu, U British Columbia, Canada Stefan
Blom and Jaco van de Pol, CWI Amsterdam, The Netherlands Ahmed
Bouajjani and Tayssir Touili, U Paris VII, France Marius
Bozga, Susanne Graf, and Laurent Mounier; IMAG Grenoble, France Marco
Bozzano, ITC-irst, Italy and Giorgio Delzanno, U Genova, Italy Randal
E. Bryant, Shuvendu K. Lahiri, and Sanjit A. Seshia; Carnegie Mellon U, USA Gianpiero
Cabodi, Sergio Nocco, and Stefano Quer; Polytechnic of Turin, Italy Arindam
Chakrabarti, U California-Berkeley, USA; Luca de Alfaro, U California-Santa
Cruz, USA; Thomas A. Henzinger, U California-Berkeley, USA; Marcin Jurdzinski,
U California-Berkeley, USA; and Freddy Y. C. Mang, U California-Berkeley,
USA Arindam
Chakrabarti, U California-Berkeley, USA; Luca de Alfaro, U California-Santa
Cruz, USA; Thomas A. Henzinger, U California-Berkeley, USA; and Freddy Y. C.
Mang, U California-Berkeley, USA Prosenjit
Chatterjee, Hemanthkumar Sivaraj, and Ganesh Gopalakrishnan; U Utah, USA Marsha
Chechik, Benet Devereux, and Arie Gurfinkel; U Toronto, Canada Yannick
Chevalier and Laurent Vigneron, LORIA Nancy, France Alessandro
Cimatti, ITC-irst, Italy et al. Edmund
M. Clarke, Carnegie Mellon U, USA; Anubhav Gupta, Carnegie Mellon U, USA;
James Kukula, Synopsis, USA; and Ofer Strichman, Carnegie Mellon U, USA Michael
A. Colón and Henny B. Sipma, Stanford U, USA Dennis
Dams, Bell Labs, USA; William Hesse, U Massachusetts, USA; and Gerard J.
Holzmann, Bell Labs, USA Cormac
Flanagan, Shaz Qadeer, and Sanjit Seshia; Compaq, USA Patrice
Godefroid, Bell Labs, USA and Radha Jagadeesan, Loyola U Chicago, USA Alex
Groce, Carnegie Mellon U, USA; Doron A. Peled, U Texas-Austin, USA; and
Mihalis Yannakakis, Avaya Laboratories, USA Sankar
Gurumurthy, U Colorado-Boulder, USA; Roderick Bloem, Graz U of Techn.,
Austria; and Fabio Somenzi, U Colorado-Boulder, USA Walter
Hartong, Lars Hedrich, and Erich Barke; U Hannover, Germany Thomas
A. Henzinger, U California-Berkeley, USA; Ranjit Jhala, U California-Berkeley,
USA; Rupak Majumdar, U California-Berkeley, USA; George C. Necula, U
California-Berkeley, USA; Grégoire Sutre, LaBRI Bordeaux, France; and Westley
Weimer, U California-Berkeley, USA Christian
Jacobi, Saarland U, Germany Victor
Khomenko, U Newcastle upon Tyne, UK; Maciej Koutny, U Newcastle upon Tyne, UK;
and Walter Vogler, U Augsburg, Germany Orna
Kupferman, Hebrew U of Jerusalem, Israel; Nir Piterman, Weizmann Inst. of
Science, Israel; and Moshe Y. Vardi, Rice U, USA Robert
Kurshan, Cadence Design Systems, USA; Vladimir Levin, Bell Labs, USA; and
Husnu Yenigun, Sebancy U, Turkey Ken
L. McMillan, Cadence Design Systems, USA Amir
Pnueli, Weizmann Inst. of Science, Israel; Jessie Xu, New York U, USA; and
Lenore Zuck, New York U, USA Mitra
Purandare and Fabio Somenzi, U Colorado-Boulder, USA Sriram
K. Rajamani and Jakob Rehof, Microsoft Research, USA Tatiana
Rybina and Andrei Voronkov, U Manchester, UK Ofer
Strichman, Sanjit A. Seshia, and Randal E. Bryant; Carnegie Mellon U, USA Aaron
Stump, Clark W. Barrett, and David L. Dill; Stanford U, USA Li
Tan and Rance Cleaveland, State U of New York-Stony Brook, USA Tomohiro
Yoneda, Tokyo Inst. of Techn., Japan; Tomoya Kitai, Tokyo Inst. of Techn.,
Japan; and Chris Myers, U Utah, USA Hakan
L. S. Younes and Reid G. Simmons, Carnegie Mellon U, USA | ||||||||||||
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